Abstract
The LiNi3/5Fe2/5VO4 has been prepared by solution-based chemical method. An orthorhombic unit cell structure with lattice parameters a = 3.7778 A, b = 15.8244 A and c = 5.5629 A is confirmed by X-ray diffraction. Frequency dependence of dielectric constant (er) at room temperature indicates the features of dielectric material. Temperature dependence of tangent loss at some selected frequencies shows the presence of dielectric relaxation phenomena in the material. Dielectric anomalies in er at different temperatures are studied by temperature dependence of er at some selected frequencies. The variant of relaxation time with temperature follows the Vogel-Fulcher relation.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
More From: Journal of Materials Science: Materials in Electronics
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.