Abstract
The topography and surface composition of thin films (ca. 100 nm) of a polystyrene-b-poly(ethylene oxide) (PS-PEO) block copolymer are investigated using a suite of complementary techniques, namely tapping mode atomic force microscopy (AFM), optical microscopy, X-ray photoelectron spectroscopy (XPS), neutron reflectometry, and wettability measurements. The copolymer films separate into lamellar structures oriented parallel to the silicon substrate, and bicontinuous and island/hole morphologies characteristic of this arrangement appear. Even though the crystalline topography of the film’s surface and its wettability properties suggest the presence of PEO on the top surface, XPS and neutron reflectometry data point undoubtedly to the presence of a top layer of PS at the air/film interface. Tapping mode AFM images unequivocally demonstrate that in air only one block is present at the air/film interface. Neutron reflectometry data identify the nature of each phase-separated layer within the film. This finding...
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