Abstract
An intelligent sensor for light wavelength readout, suitable for visible range optical applications, has been developed. Using buried triple photo-junction as basic pixel sensing element in combination with artificial neural network (ANN), the wavelength readout with a full-scale error of less than 1.5% over the range of 400 to 780 nm can be achieved. Through this work, the applicability of the ANN approach in optical sensing is investigated and compared with conventional methods, and a good compromise between accuracy and the possibility for on-chip implementation was thus found. Indeed, this technique can serve different purposes and may replace conventional methods.
Highlights
The use of wavelength measurement has a wide range of applications, varying from fiber-optic communication to biological purposes, such as DNA sequencing, including many engineering applications
artificial neural network (ANN) are commonly used for measurement sensor systems, in this scope, several works has been reported in [8,9,10,11,12,13,14,15,16,17,18,19,20], where the aims of their applications are to increase the selectivity, sensitivity, and reliability of many sensor types
ANNs are powerful data modeling tools, where the advantage lays in their ability to represent both linear and non-linear models by learning directly from data measurements
Summary
The use of wavelength measurement has a wide range of applications, varying from fiber-optic communication to biological purposes, such as DNA sequencing, including many engineering applications. ANNs are commonly used for measurement sensor systems, in this scope, several works has been reported in [8,9,10,11,12,13,14,15,16,17,18,19,20], where the aims of their applications are to increase the selectivity, sensitivity, and reliability of many sensor types This work carries this ideas one step further by applying similar techniques for wavelength readout, structured in a row of BTJs, in purpose of an embedded system for real time applications; featuring relative low full-scale error and a compatibility with BICMOS process which increase the system portability
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