Abstract
Cd 1−x Zn x Te thin films were prepared on 7059 Corning glass substrates using an rf magnetron sputtering system and CdTe(1−y)+ZnTe(y) targets. The concentration (x) of Zn in the films did not coincide with the relative weight (y) of the ZnTe powder in the compressed targets. Values of x were in the range 0–0.30 as determined from x-ray diffraction patterns. The band gap energy (Eg) of the Cd1−xZnxTe samples was calculated from the photoreflectance spectra measured on the films. The position of the experimental points in the Eg versus x plot show a deviation from the phenomenological quadratic relation Eg=Eg0+ax+bx2 calculated within the virtual crystal approximation (VCA). The depart of the Eg values for higher Zn concentrations from the expected VCA model is probably due to a larger clustering of Zn atoms and/or a percolation phenomena. We obtain fitted values for the parameters a and b within the VCA approach. Comparison with data reported by other authors is made.
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