On the Bias of Terminal Based Gain and Offset Estimation Using the ADC Histogram Test Method

Abstract

The Histogram Test method is a popular technique in analog-to-digital converter (ADC) testing. The presence of additive noise in the test setup or in the ADC itse lf can potentially affect the accuracy of the test results. In this study, we demonstrate th at additive noise causes a bias in the terminal bas ed estimation of the gain but not in the estimation of the offset. The estimation error is determined analytically as a function of the sinusoidal stimulus signal amplitude and the noise standard de viation . We derive an exact but computationally difficult expression as well as a simpler closed form approxi mation that provides an upper bound of the bias of the terminal based gain. The estimators are validated n umerically using a Monte Carlo procedure with si mulated and experimental data.