Abstract
Ellipsometry is a well-established, nondestructive optical method for the characterization of thin films. An ellipsometric experiment yields in the thin film limit only a single parameter η, which is related to changes in the state of polarization caused by reflection. The ellipsometric quantity is only subject to certain conditions proportional to the adsorbed amount Γ. The necessary requirements leading to the proportionably are not met for adsorption layers of soluble surfactants at the air−water interface since the dielectric constants e of all media are very similar. It is not possible to establish from first principles (Maxwells equations) a unique relation between state of the monolayer and η. The derived expression cannot be inverted, and it is not justified to assume a linear relation between η and the surface excess Γ. The aim of this contribution is to obtain an understanding what η represents for soluble surfactants at the air−water interface. For the purpose of this study a soluble surfactant...
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