Abstract
In the process of designing complex chips and systems, the use of benchmark designs is often necessary. However, the existing benchmark suites are not sufficient for the evaluation of new architectures and EDA tools; synthetic benchmark circuits are a viable alternative. In this paper, a systematic approach for the generation and evaluation of synthetic benchmark circuits is presented. A number of existing benchmark generation methods are examined using direct validation of size and topological parameters. This exposes certain features and drawbacks of the different methods.
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