Abstract

This paper deals with an empirical Bayes test δ* n for testing H 0 : θ ≤ θ0 against H 1 : θ > θ0 in the positive exponential family f(x\\ θ) = c( θ) u(x) exp(−x/θ), x > 0, 0 < θ ≤ M < ∞, using a weighted quadratic error loss. We investigate the asymptotic optimality of the empirical Bayes test δ* n . It is shown that the regret Bayes risk of δ* n converges to zero at a rate of order O(n −1). This convergence rate provides a solution to the question, raised by Singh (1979) and Singh and Wei (1992), regarding the achievement of the best possible rate in empirical Bayes problems.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.