Abstract
An advanced on-line thickness meter for transparent and extra thin film has been developed based on a spectral analysis method. This is applicable for measuring the hydrated chromium oxide layer of about 5 to 25 nm in thickness on Tin Free Steel. The main features of this thickness meter are mainly the use of ultraviolet wavelengths, and a very simple and devised structure. Moreover, it has good accuracy and stability against various kinds of disturbances which occur at on-line measurelent. The thickness meter is also available for the measurement of other transparent thin films.
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