Abstract
An advanced on-line thickness meter for transparent and extra thin film has been developed based on a spectral analysis method. This is applicable for measuring the hydrated chromium oxide layer of about 5 to 25 nm in thickness on Tin Free Steel. The main features of this thickness meter are mainly the use of ultraviolet wavelengths, and a very simple and devised structure. Moreover, it has good accuracy and stability against various kinds of disturbances which occur at on-line measurelent. The thickness meter is also available for the measurement of other transparent thin films.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.