On-line registration of femtosecond time intervals based on polarization properties of femtosecond stimulated photon echo generated on exciton states

A.U Bakhodurov,S.V Chekalin,I.I Popov,V.O Kompanets,E.A Vinogradov,S.E Putilin,K.Sh Gazizov,N.S Vashourin,V.V Samartsev,A.A Kalachev,K.R Karimullin,A.V Naumov,M.G Gladush

doi:10.1051/epjconf/201716103008

Abstract

This paper reflects the results of the research on the character of the dependence of the non-Faraday rotation of the femtosecond stimulated photon echo polarization plane on the time interval between the second and third exciting pulses, discretely varying from 180 to 900 fs in increments 180 fs. The time interval between the first and second pulses was equal to zero. The echo signal was formed at room temperature on exciton states localized on the surface defects of a thin three-layer textured ZnO/Si(P)/Si(B) film in the presence of a homogeneous magnetic field of 0.25 mT applied longitudinally to the optical excitation axis. The qualitative coincidence of the investigated dependence with the theoretical prediction of the investigated effect for gaseous medium is shown.

Highlights

Stimulated photon echo (SPE) was excited at room temperature by three laser pulses on exciton states localized on nanoscale surface defects of a three-layer ZnO/Si(B)/Si(P) thin film
The difference in the polarization plane of a femtosecond SPE excited on exciton states localized on the surface defects of a thin three-layer textured ZnO/Si(P)/Si(B) film depending on the presence of a magnetic field is given in the following work [1]
The decrease in the angle of rotation of the PE polarization plane with the growth of the time interval τ23 qualitatively confirms the coincidence of the results obtained with the theoretical prediction [3] of the tangential dependence of this effect for gaseous medium on the value of the time interval τ23

Summary

Introduction

Stimulated photon echo (SPE) was excited at room temperature by three laser pulses on exciton states localized on nanoscale surface defects of a three-layer ZnO/Si(B)/Si(P) thin film (each layer had a thickness of 100 nm). The dependence of the intensity of the SFE signal on the angle of rotation of the prism relative to the plane of polarization of the exciting laser pulses was recorded.

Results

Conclusion