Abstract
The design basis of a dual detection channel spectrometer for general application in atomic fluorescence analysis is discussed. Low frequency modulation of the radiation from a single light source is employed with one channel set at a fluorescence wavelength while the second channel measures the magnitude of scattering at a non-fluorescent wavelength. The instrument has been applied to the analysis of trace Au and Cd in high scattering matrix solutions. The statistical treatment of data, and the method of calculating detection limits, is discussed.
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