Abstract
In this paper, we present a new method for the built-in self-testable data path synthesis based on integer linear programming (ILP). Our method performs system register assignment, built-in self-test (BIST) register assignment, and interconnection assignment concurrently to yield optimal designs. Our experimental results show that our method successfully synthesizes BIST circuits for all six circuits experimented on. All the BIST circuits are better in area overhead than those generated by existing high-level BIST synthesis methods.
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