On Diagnosis of Retaining Faults in Circuits

Abstract

Diagnosis of faults in circuits is important field of applications of rough set theory and test theory. The problem of search an optimal circuit basis for an arbitrary closed class of Boolean functions is considered. The basis should be optimal in the sense of simplicity of diagnosis of so-called retaining faults in iteration-free circuits over the basis. This problem is solved for all closed classes. In the paper the complexity of diagnosis of retaining faults in iteration-free circuits over optimal bases is studied.