Abstract
The method for determination of volume fraction of crystalline phase in amorphous-crystalline materials is proposed. The method is based on the analysis of X-ray patterns obtained under study of structure-phase changes in nanocrystalline Finemet- type alloys. Verification of the method was carried out with the use of X-ray diffraction data (including small-angle X-ray scattering) of specimens in as-quenched amorphous state as well as after annealing at various temperatures, which provided formation and growth of crystals in amorphous matrix with sizes in a range from 2 to 15 nm. The method is the most effective under nanocrystals' size exceeding 5–6 nm, when their further increase does not affect the height and width of diffraction reflexes.
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