Abstract
The possibility of interactively controlling the surface curvature of a single-crystal Si(100) plate used as a diffraction element is investigated. The initial component-surface profile is specified by the substrate shape, parameters of the adhesive, and the temperature of its adhesion to the substrate. The results of calculating the changes in surface profile and its curvature radius are presented.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
