Abstract
We have demonstrated the high-speed operation up to 55 GHz with a bias margin of ±5.5% for a shift register based on the single-flux-quantum logic circuit. The shift register is employed in the rate transfer circuit in high-end network switches that are made up with the cell-based design technique. The on-chip test system was used for measuring the operation frequencies, and the test system itself was built by combining the cells to satisfy the boundary conditions between the test system and the circuit-under-test. As a result, the on-chip test system developed in this study has high flexibility.
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