On-chip characterization of low-noise microstrip-coupled transition edge sensors

Abstract

Transition edge sensors (TESs) are used extensively in millimeter-wave and submillimeter-wave astronomy. The next technological push is to reduce the noise equivalent powers from 10−17 to 10−20 W Hz−1/2 in order to take full advantage of the exceptionally low backgrounds associated with cooled-aperture space telescopes. We describe a lab-on-a-chip (LoC) for measuring the small-signal and noise properties of ultralow-noise microstrip-coupled TESs. The LoC comprises two suspended SiNx membranes, one of which supports a single-mode, variable-temperature blackbody source, and the other a microstrip-coupled TES. The two devices are connected by a superconducting microstrip transmission line. The temperature of the source is determined by Johnson noise thermometry using superconducting quantum interference device readout. In this paper, we describe the theory, layout, operation, and calibration of the experimental system and report on two prototype devices. The LoC concept has many advantages, and already we have been able to assess the optical efficiencies of our TESs. We have started to gain an appreciation of the losses associated with 100–300 GHz microminiature superconducting microstrip transmission lines at low temperatures. The next phase of our work is to apply the technique to ultralow-noise detectors, to study fluctuation phenomena in multimode devices, and to investigate the behavior of more complicated integrated circuits.