Abstract
A method for calculating the characteristics of a metal film in a dielectric surroundings is suggested. The most interesting case of asymmetric metal-dielectric sandwiches, in which the dielectrics on both sides of the film are different, is considered in the context of the Kohn-Sham modified method. The spectrum, the electron work function, and the surface energy of polycrystalline and single-crystal films placed into passive insulators are calculated for the first time. In general, the dielectric surroundings leads to a negative change in the electron work function and the surface energy. In addition to size-effect-related changes, the shift of the work function is determined by the arithmetic mean of the dielectric constants of the surrounding media. Calculations have been performed for Na, Al, and Pb.
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