Abstract
Superlattices consisting of CdTe and ZnTe have been grown using atmospheric pressure OMVPE. Structural characterization by X-ray diffraction and transmission electron microscopy along with optical characterization using photoluminescence and photoreflectance has been completed. Exceptionally bright luminescence emission compared to the corresponding alloys is observed, indicating the excellent optical quality of these layers. Similarly, in photoreflectance, we are able to observe several confined states, confirming the presence of the superlattice. Structurally, the layers exhibit a high density of defects, presumably due to the relatively large lattice and thermal expansion mismatch between CdTe, ZnTe and the GaAs substrate.
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