Abstract
The Materials Microcharacterization Collaboratory (MMC), a pilot project of the DOE2000 program, links DOE-sponsored electron microscope user facilities at ANL, LBNL, ORNL and UIUC with that at NIST to form one collaboratory. The MMC brings the microcharacterization and microanalysis tools available in these national centers to geographically-dispersed researchers working in industries,universities, and government laboratories. It enables remote users to share on-line the instrumentation, knowledge and expertise available at the individual facilities making up the collaboratory.On-line services available to users of the MMC may be classified as instrument, computational, and exchange services (fig. 1). LBNL's contribution to the MMC's instrumentation includes a Kratos EM-1500 HVEM (for remote in-situ high-voltage microscopy) and a Philips CM300 HREM (remote highresolution capability). DeepView is an exchange service that provides a common graphical userinterface (GUI) for control of MMC instruments over the wide area network (both the client and server sides of DeepView are available for download).
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