Abstract
Model supports consisting of a thin layer of SiO 2 on a silicon single crystal have been used to study the WO 3/SiO 2/Si (100) catalyst precursor. Compared to the powder analogues, a drastic increase in spectral resolution and detailed band structure is observed in the XPS spectra. Conventional XPS, angle dependent and depth profiling X-ray photoelectron spectroscopy show the presence of two types of tungsten oxide on the surface: microcrystallites of WO 3 and a tungsten oxide monolayer chemically bonded to the silica matrix.
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