Abstract
The characterization of electroless Pd contacts to p-ZnTe has been carried out by measuring the current-voltage curves and Auger sputter depth profiles. On the basis of the shape of the I-V characteristics, it can be concluded that electroiess Pd makes a contact of much better quality than electroless Au and Pt contacts. The best contacts are achievable for Pd electrode by annealing at 200 °C. The specific contact resistance under this condition is estimated to be as low as 6 × 10 −4 Ω cm 2 for p-ZnTe with a hole concentration of 3 × 10 17 cm −3 by the method of Cox and Strack. For electroless Pd, Pd-ZnTe alloy is formed. On the other hand, electroless Au leaves oxygen contamination near the interface between ZnTe and metal, whereas electroless Pt brings out the Te intermediate layer.
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