Abstract

In the development of high energy laser (HEL) beam diagnostic equipment with optical attenuation by dielectric multilayer films reflector, in order to fulfill the sampling uncertainty request of the system, the transmittance of the attenuator should keep as a constant or only vary in a small range when the incident angle of laser changes. To address this, we analyzed the principle of the conventional dielectric multilayer films reflector and put forward a new and simple offset-central-wavelength multilayer films reflector (OCWMFR) involving no change of the dielectric multilayer films materials and basic fabrication process. Theoretical simulation and experimental results show that the reflector has a good transmittance consistency and can meet the attenuation and sampling requirement of HEL beam diagnosis.

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