Offline estimation of 2 D crystal lattice parameters by processing the electron diffraction image

Abstract

Electron diffraction provides useful information about the internal composition of materials and has been in the use of material scientists for more than fifty years. In order to extract useful information from offline diffraction images, they are manually analyzed by using some photometric technique. Manual analysis is however a cumbersome, laborious and difficult task. To reduce the labors of material scientists one can employ image processing techniques to perform automated analysis, due to the well established popularity and clear evidence of widely used image processing techniques. In this work an image processing technique is being proposed for the extraction of 2D unit cell information from diffraction images on one hand and finding the 2D point group contained by the lattices on the other. The technique employs a morphological shrinking operation to find the center of each spot in the underlying preprocessed diffraction image. This is followed by the extraction of eight points with reference to the spot produced by the transmitted electron beam. The resultant nine points, i.e. the extracted eight plus the reference spot generated by the transmitted electron beam, are then subjected to symmetry operations, rotation symmetry and mirror symmetry, in polar coordinate system, to classify the point group of the lattice produced by the electron diffraction. One of the difficult task, even in manual analysis, is to ascertain the exact spot where the transmitted electron beam hit the sample at the time of realization of the image. This has been accurately and intuitively done by employing the notion that the transmitted spot must have greater number of pixels, with the highest gray value, among the diffracted spots. The proposed strategy has been applied to a sample set of various images and the results shows that the technique is efficient in determining the unit cell in 2D and classify the point group with good accuracy.