Abstract
It was observed recently that the giant magnetoimpedance (GMI) effect in Fe-rich glass-coated amorphous microwires with positive magnetostriction can be improved significantly by means of post-annealing. The increase in the GMI is attributed to the induced helical magnetic anisotropy in the surface layer of the microwire, which appears after the annealing. The application of external stresses to the microwire may result in changes in its magnetic structure and affect the GMI response. In this work, we study theoretically the influence of the tensile and torsional stresses on the off-diagonal magnetoimpedance in annealed amorphous microwires with positive magnetostriction. The static magnetization distribution is analyzed in terms of the core–shell magnetic structure. The surface impedance tensor is obtained taking into account the magnetoelastic anisotropy induced by the external stresses. It is shown that the off-diagonal magnetoimpedance response exhibits strong sensitivity to the magnitude of the applied stress. The obtained results may be useful for sensor applications of amorphous microwires.
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