Occlusion Avoidance for Microassembly Using A Variable View Imaging System

Abstract

Occlusion is an important issue in conventional microscopes using in the microassembly and micromanipulation. This paper presents an occlusion avoidance method using a variable view imaging system that enable adjustment of the view orientation and position to avoid occlusion and keep target in side field of view. The system integrates a telecentric scanner and a double wedge prisms system which can supply a flexible view with adjustable zenith and azimuth angles. This design simplified the operation of system by decoupling the scanning mirror angle with the view zenith and azimuth angles. In order to obtain a desired view direction to avoid occlusion, the artificial potential field was applied for calculation of rotation angles double wedge prisms. Different interested surfaces can be combined in the artificial potential field and the angles of prisms for the best view direction without occlusion can be obtained. The view position is steered by visual feedback method, which eliminates the requirement of accurate system calibration. Simulations and microassembly experimental results are provided to verify the feasibility of the proposed approach.