Obtaining of polycrystalline CdTeO 3 by reactive pulse laser deposition

Abstract

We report the obtaining of as-grown polycrystalline CdTeO 3 thin films grown by the reactive pulsed laser deposition technique in a controlled atmosphere of pure oxygen. X-ray diffraction (XRD) shows no CdTe presence and peaks, corresponding to single-phase of face-centred cubic of polycrystalline CdTeO 3, are well-defined, with a calculated grain size of about 120 nm and a compressive strain of 0.083%. X-ray photoelectron spectroscopy (XPS) shows 11% of CdTe and 89% of CdTeO 3. This CdTe, which was not present in XRD measurements, was related with Te reduction in the surface during the XPS measurement. Atomic force microscopy shows a mainly smooth surface with spheroid-like grains.