Abstract
Different fixation methods have significant influence on observation of samples by scanning electron microscopy when non conductive samples are processed by plasma spudtter coating method. Non conductive powder samples using different treatments are observed on Philips XL30 scanning electron microscope and Hitachi S-4800 field emission scanning electron microscope. For the small size samples processed by two fixation methods, Sample shape were observed more clearly by the ultrasonic dispersion preparation on scanning electron microscope and had less interference of ion sputtering thermal effect. The effect is not obvious for the large size samples, and the effect of observation for non conducting samples is better on field emission scanning electron microscope at low accelerating voltage.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
