Abstract
A technique has been developed for measuring the switching fields of individual submicron magnetic particles using a magnetic force microscope (MFM) in which an in situ magnetic field can be applied. This allows the study of the evolution of the particles' magnetic states as a function of applied field and the direct observation of cooperative switching. Observations of the switching fields for individual nanolithography Permalloy particles are compared with remanent magnetization data, taken with an alternating gradient magnetometer on both isolated and interactive arrays of these particles. Comparison of MFM images of the particles with numerical simulations has provided insight into the magnetic behavior of the sensing tips.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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