Abstract
Supported metal particle catalysts have found wide application in the chemical industry and for environmental control. Many microscopy techniques have been employed to study these catalysts. Although scanning electron microscopy(SEM) is not commonly used, its ability to provide surface topological information as well as the ease of sample preparation and observation are positive attractions for catalysis research. Due to limited SEM resolution in the past, as well as severe charging of the insulating catalyst supports, very few studies of catalysts using SEM appear to have been reported. Recent development of in-lens specimen immersion systems and cold field emission sources of high brightness have made it possible to image specimen surfaces with secondary electrons at subnanometer resolution. Using a high resolution Hitachi S-5000 in-lens field emission SEM, we have studied Pt particles supported on TiO2 and CeO2. The purpose of this study was to evaluate relative merits and demerits of high resolution SEM for catalysis research, in particular with respect to TEM and STEM techniques.
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