Abstract
We have performedI-V measurements on high-quality Nb/Al-AlOx/Nb Josephson junctions. All curves exhibit subgap structures. Some junctions exhibit in theI-V curves the (Δ1–Δ2)/e singularity, due to the presence of niobium films with different gaps. In these devices we observed sharply separated structures corresponding to the series 2Δ1/ne and 2Δ2/ne, with n≤3 corresponding to the tunneling of two and three electrons. The respective amplitudes of the two structures atn=2 allow one to conclude that the phenomenon is a multiparticle tunneling process.
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