Abstract
Stress induced grain boundary migration was experimentally investigated in aluminum bicrystals. Migration of planar symmetrical <100> and <111> tilt boundaries under a shear stress was observed to be accompanied by a lateral translation of the adjacent grains. This coupling proved to be the typical migration mode for all investigated boundaries, no matter whether low-or high angle, low Σ CSL coincidence or non-coincidence boundary. The migration-shear coupling was also observed for asymmetrical tilt boundaries. Measurements of the temperature dependence of coupled boundary migration revealed that there is a specific misorientation dependence of the migration activation parameters. Contrary to expectations, a high angle Σ7 tilt boundary moved under an applied stress, but produced practically no shear during its migration.
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