Abstract
We have used high-temperature scanning tunneling microscopy (STM) to study in real time SrTiO 3 step edge dynamics in the 600°C to 800°C temperature range. We observed a dramatic transformation of the step edge structure above 690°C, involving step edge straightening due to rapid migration of surface atoms. The STM study shows that if a NH 4F-HF-etched substrate is annealed at 800°C, a well-ordered surface, suitable for high-T c superconductor thin film deposition, can be produced.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
