Abstract
We have used high-temperature scanning tunneling microscopy (STM) to study in real time SrTiO 3 step edge dynamics in the 600°C to 800°C temperature range. We observed a dramatic transformation of the step edge structure above 690°C, involving step edge straightening due to rapid migration of surface atoms. The STM study shows that if a NH 4F-HF-etched substrate is annealed at 800°C, a well-ordered surface, suitable for high-T c superconductor thin film deposition, can be produced.
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