Abstract

The Mn4-xAuxN films were grown on MgO(001) substrates by plasma assisted molecular beam epitaxy. The magnetic characteristics and spin transport properties are systematically studied. A sign reversal of anomalous Hall coefficient is observed at 160 K in Mn3.5Au0.5N. This phenomenon can be attributed to the competition between electron-like and hole-like anomalous Hall effects (AHEs). The mutual eliminating of electron-like and hole-like AHEs gives rise to zero resistivity of 160 K at high field. A butterfly-like curve with two humps is observed at 160 K, which can be ascribed to the skyrmion-induced topological Hall effects (THEs). It is thus confirmed that the transverse resistivity in Mn3.5Au0.5N comprises of three components: electron-like AHEs, hole-like AHEs, and skyrmion-induced THEs. An effective method was employed to analyze THEs in the material systems that contain both electrons and holes. The THEs in Mn3.5Au0.5N can be observed after electron-like AHEs are subtracted down from transverse resistivity.

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