Observation of parametric X-ray radiation for the asymmetric Laue geometry

Abstract

Angular distributions of parametric X-ray radiation from 255-MeV electrons in a thin Si crystal have been investigated for asymmetric Laue geometries using an imaging plate as a two-dimensional position-sensitive X-ray detector. The peak intensities of parametric X-ray radiation observed for (111) and (1¯1¯ 1) reflections, normalized by taking into account the effective target thickness and the transmission fraction of X-rays in the crystal, coincided within several percent. A large intensity difference depending on the asymmetry parameter, which is predicted by a dynamical theory dealing with the asymmetric Laue geometry, was not observed under the present experimental conditions. This indicates that the dependence of angular distributions of parametric X-ray radiation on the asymmetry parameter is negligibly weak, i.e., that it can be well explained by the well-established kinematical theory and dynamical theory as well as those for symmetric Laue and Bragg geometries.