Observation of Magnetic Domain Structure of Micro Magnetic Materials and Magnetic Thin Films by Photoemission Electron Microscope (PEEM)

Abstract

The photoemission electron microscopy using synchrotron radiation (SR-PEEM) combined with the X-ray circular and linear dichroism (XMCD and XMLD) is one of the most powerful techniques to investigate the magnetic domain structure of micro magnetic materials or surfaces and interfaces of magnetic thin films. With the method, we can observe the magnetic domain structure directly to a very high spatial resolution. In this paper, the technique of SR-PEEM for the observation of the magnetic domain structure and its applications to the Ni-micro ring, and the ferromagnetic/antiferromagnetic interface, i.e. the Fe wedge/NiO(001), are introduced.