Abstract
In a previous conference, STM’91, we reported the several kinds of lattice defects on microcrystalline graphite. For a further investigation of electronic structure around lattice defects, spectroscopic measurements at low temperatures are desired. A scanning tunneling microscope/spectroscope (STM/STS) workable at low temperatures and in ultrahigh vacuum has been constructed. The system has a surface-cleaning apparatus for removing contamination by pulse laser beam. In order to select a view area, an optical microscope and a movable sample stage are also equipped. At present, atomic STM images on HOPG, microcrystalline graphite, and bulk gold are observed at room temperature. At low temperatures near 60 K, irregular atomic structures of microcrystalline graphite are also observed. These results indicate the STM/STS system is appropriate for the STM/STS measurements at low temperatures.
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More From: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
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