Abstract
Abstract Thick films of granular aluminium dispersed in a tellurium-rich matrix have been formed by co-deposition of the pure elements. Correlation of Rutherford backscattering and superconducting critical-field measurements demonstrates that the films are subdivided into compositionally and electrically distinct layers typically 400–600 A thick extending across large areas of the specimens. Comparison with the superconducting properties of granular Al: Al2O3 supports earlier suggestions that similar layering is present in that system.
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