Abstract
ABSTRACTAn organic molecular beam epitaxy (OMBE) system has been designed and constructed with in situ reflection high-energy electron diffraction (RHEED) specifically for the deposition of organic molefelar layers under ultrahigh vacuum (UHV), the order of 10–10 torr. The system is equipped with a portable UHV chamber which allows easy transfer of the OMBE film samples to a separate UHV scanning tunneling microscopy (STM) system. A structural investigation of heteroepitaxially grown organic ultrathin layers of copper phthalocyanine (CuPc) on inorganic substrates was carried out by the combined UHV system from less than a monolayer of CuPc.
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