Abstract
We report the observation of fractal patterns in C60-tetracyanoquinodimethane thin films. The fractal patterns and their microscopic features are described and characterized. The fractal dimension was determined to be 1.69 ± 0.07. According to the characterization results, the observed fractals are compared to the cluster-diffusion-limited-aggregation model. The growth of the fractal patterns in the thin films is also in terms of the existing long-range correlation.
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