Abstract
We have investigated the characteristics of the exciton polaritons in a ZnO microcavity. The microcavity consists of an effective one-wavelength thick ZnO active layer and HfO 2 /SiO 2 distributed Bragg reflectors (DBRs) at the bottom and top. We adopted rf magnetron sputtering and pulsed laser deposition for the preparation of the DBR and ZnO layer, respectively. Angle-resolved reflectance and photoluminescence spectra demonstrate the formation of the cavity polaritons. The cavity polariton dispersions are analyzed using a phenomenological Hamiltonian for the coupling between the cavity photon and three kinds of fundamental excitons labeled A, B, and C. The vacuum Rabi splitting energy is estimated to be ∼80 meV. The giant Rabi splitting energy reflects the large exciton oscillator strength of ZnO.
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