Observation of effect of temperature on X-ray diffraction intensities across the InKabsorption edge of InSb

Abstract

Variations at room and liquid-nitrogen temperatures have been observed of the energy-dispersive integrated X-ray reflection intensity from an InSb single crystal across the In K absorption edge by the use of a multi-channel solid-state detector. The results show that the relative intensities from a nearly perfect crystal change as a function of the temperature above and below the absorption edge, but there is no such change in a nearly mosaic crystal. This variation observed in a nearly perfect crystal is characteristic of an absorbing monatomic perfect crystal and can be explained in terms of the dynamical theory of diffraction including anomalous scattering.