Abstract
We developed a time-resolved optical beam induced current (TROBIC) technique, and performed time-resolved current imaging experiments on GaAs/AlxGa1−xAs heterostructures under high electric field conditions. These experiments are the first time-resolved imaging experiments of current patterns in a two-dimensional semiconductor structure. We attribute the current patterns observed in the TROBIC images to the formation of current filaments in the AlxGa1−xAs layer, parallel to the two-dimensional electron gas (2DEG). We show that even in samples where the two-dimensional electron gas and the contacts to the 2DEG are perfectly ohmic and homogeneous, current filaments can still develop in high electric fields. These temporal and spatial instabilities in the AlxGa1−xAs layer strongly affect the high-field transport properties of the heterostructure.
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