Abstract
Observation of charge coupling effect is important to characterize the electrical behaviors of triple-junction solar cells (TJSCs). Electric modulus (M) spectroscopy incorporated with adequate lasers is demonstrated to be an effective approach to investigate the internal electrical characteristics of the individual subcells in InGaP/InGaAs/Ge TJSCs. The distinct characteristic peaks of imaginary part of M corresponding to three individual subcells are identified, as specific lasers are applied. The charge coupling between the excited subcell and neighboring subcell is observed, which causes the expansion of the depletion region in the latter. This approach provides the information of charge coupling for the design of TJSCs.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
