Abstract
The effect of prolonged annealing at low temperature has been studied in samples using Rutherford backscattering spectroscopy, X-ray diffraction, and four-point probe techniques. We observed that at a considerable amount of and was formed. After annealing at only a fraction of total amount of Ni has been converted into and phases and around 60% of nickel remains unreacted. Formation of the and silicides at is slow and seems to saturate after approximately . It is observed that after annealing the amount of both silicides is almost equal to that after annealing. After annealing at there is no indication of either or , and all Ni was consumed and only the stable NiSi phase is detected.
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