Abstract
X-ray photon correlation spectroscopy was employed in a surface standing wave geometry in order to resolve the thermally driven in-plane dynamics at both the surface/vacuum (top) and polymer/polymer (bottom) interfaces of a thin polystyrene (PS) film on top of Poly(4-bromo styrene) (PBrS) and supported on a Si substrate. The top vacuum interface shows two relaxation modes: one fast and one slow, while the buried polymer-polymer interface shows a single slow mode. The slow mode of the top interface is similar in magnitude and wave vector dependence to the single mode of the buried interface. The dynamics are consistent with a low-viscosity mixed layer between the PS and PBrS and coupling of the capillary wave fluctuations between this layer and the PS.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
