Abstract
The transition from a high-resistance to a low-resistance state has been observed in a silicon bicrystal. This phenomenon is attributed to the trapping of minority carriers at the grain-boundary interface states. In the low-resistance state, the dc resistance of different samples falls into a narrow range of values, and exhibits, in addition, a positive temperature coefficient.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have