Abstract
In this article, we have reviewed various advanced broadband and pulsed measurement techniques which have been developed for sampler-based NVNAs. We have seen that the RF modulation capability of sampler based NVNAs was not limited by the IF bandwidth of its receiver. Two methods for pulsed-RF, pulsed-bias measurements were also presented. The method based on the concept of multiple recordings enables one to achieve pulsed-RF measurements with 0 dB desensitization (no dynamic range degradation) even for very low duty cycles. Real-time active load-pull techniques for the rapid design of microwave power amplifiers were also presented. Finally, it was demon strated that pulsed-RF real-time active-load-pull could also be performed for the rapid design of pulsed-RF PAs or the characterization of transistors with reduced memory effects. These various measurements with sampler-based NVNAs were made possible thanks to the use of advanced ADC triggering techniques.
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