Abstract
A pyramid-type microstrip probe (PTMP) with metal tips is proposed for scanning near-field microscopes to obtain high spatial resolution of a few nanometers and high optical efficiency. Properties of an ordinary PTMP and the PTMP with a single metal tip are investigated by using a rigorous finite-integral technique simulation (MICROWAVE STUDIO package) and analyzing characteristics of working modes of the probe. Numerical simulation has demonstrated that an ordinary PTMP and the PTMT with a single metal tip exhibit large far- and near-transmission coefficients, field enhancement, and high spatial resolution. These high parameters imply that both types of microstrip probe may be utilized for optical and magnetic data storage, nanolithography, and other types of nanotechnology that use light for modification of a thin surface layer.
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