Abstract
Membrane fouling is a problem of vital importance in microfiltration. A numerical method was used to investigate the membrane fouling phenomenon during microfiltration of semiconductor wastewater. In the numerical model, the concentration-dependent physical properties were considered and a dynamically updating boundary condition was incorporated to deal with the flux variation with fouling resistance. The mechanism of suspension transition from liquid phase to gel phase was adopted to characterize the formation of membrane fouling. With this method, the flow field and the concentration distribution as well as the fouling resistance in the membrane module were obtained. The results revealed the mass transfer character in the concentration boundary layer and its influence on the formation of membrane fouling. The enhancement effect of cross-flow on membrane filtration was analyzed in terms of wall shear rate and dimensionless Peclet number. Agreement between the simulation and the experimental results demonstrated the applicability of this numerical method in evaluating membrane fouling during microfiltration.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
